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Convenient,
Hands-Free Probing
To access the
ever-increasing variety of test points, today’s probing solutions need
to be versatile, small, and lightweight. The new HFP series of probes
meets these needs with high bandwidth, miniature size and a variety of tip
styles, making probing easier than ever.
In combination with these
innovative probe tips, the unique HFP FreeHand probe holder will
hold the probe on test points to maintain signal fidelity. The end result
of HFP “hands-free” probing is the enhanced ability to analyze
waveforms instead of having to focus energy on keeping the probe itself in
place.
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IC
Lead Tip
Covered
in insulation on all sides (except for a small wedge), this tip was
designed to prevent shorting IC leads.
It is one-size-fits-all, and will work with any IC lead
pitch. |
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Discrete
SMD Tip
The
crescent shape of this tip is designed to fit tightly on capacitors,
resistors, transistors and other surface mount components.
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Bent
Sharp Tip
Made
out of titanium, this tip is ideal for situations that force the
user to hold the probe parallel to the circuit board under test.
Also gives user more control when holding probe like a
pencil. |
Additional
Tips
There are two
additional probe tips, the straight tip and the sharp tip.
The straight tip is a normal tip, and is very durable; the sharp
tip is made out of titanium, and allows for greater accuracy when probing
small circuit board vias.
HFP1000, HFP1500, HFP2500 Probe Models
Leading Specifications
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1
GHz, 1.5 GHz, and 2.5 GHz Bandwidth
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0.7 pF Input Capacitance
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±8 V Dynamic Range
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±12 V Offset Range
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5 Interchangeable Tips for Probing a Variety of Test
Points
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Replaceable Probe Tip Socket
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Hands-Free Probing with
FreeHand probe
holder
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AutoColor ID Feature Matches the Probe Color to the Trace Color
AutoColor ID
When the probe is connected to a WavePro scope, our new patent-pending AutoColor ID feature automatically senses and illuminates the probe head in that channel’s trace color. You no longer need to worry about plastic rings or colored tape to identify which channel on the scope is connected to a
particular test point. |
